Contouring by modified dual-beam ESP} based on tilting illumination beams
نویسندگان
چکیده
CoeItOllriag by modirttd daaal-be.m ESPI bueiI on tiltialil iII~ mialtiollll tams. A new contouring method by mcxlificd dual-beam electronic speckle pattern interferometry is proposed. Instead of tilting test objoct as used in previous single: wavelength techniques by ESPI, we introduce a tilt 10 tbe illuminating beams in order to obtain the conlour fringe patterns. The most attractive feature of this tecbnique is the possibility of contouring a stationary object so that it would be a more promising method in practical engineering metrol· ogy. The thcoretKal and experimental results show good agm:meot.
منابع مشابه
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